X-Strata920 EDXRF Spectrometer from Hitachi High-Tech America, Inc.

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Hitachi High-Tech America, Inc. for
X-Strata920 EDXRF Spectrometer

Description

The X-Strata920 is a high-precision benchtop XRF analyzer that comes with a huge range of options to accommodate many types of samples. Ideal for measuring coatings on a range of substrates, this analyzer is ideal for electronics, connectors, decorative items and jewelry analysis where product quality must be established.

Features
  • Adaptable design for reliable analysis of a wide range of products
  • Automated focusing and optional motorized stage improves accuracy and speed
  • Intuitive SmartLink software makes taking and exporting measurements easy
  • Multi-collimator design for utmost accuracy for every sample
  • Choice of proportional counter or silicon drift detector (SDD) to suit application
  • Conforms to industry norms, such as IPC-4552A, ISO3497, ASTM B568 and DIN50987
  • Easy sample loading and fast analysis delivers results in seconds
  • Powerful optics to analyze single-layer and multi-layer coatings, including alloyed layers